Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry: A Correlation of Conductivity and Bandgap Energy Measurements-Reference-Cited by-同舟云学术

Characterization of Doped Amorphous Silicon Thin Films through the Investigation of Dopant Elements by Glow Discharge Spectrometry: A Correlation of Conductivity and Bandgap Energy Measurements

Published:2011-03-30 Issue:4 Volume:12 Page:2200-2215
ISSN:1422-0067
Container-title:International Journal of Molecular Sciences
language:en
Short-container-title:IJMS

Author:

Sánchez Pascal,Lorenzo Olaya,Menéndez Armando,Menéndez Jose Luis,Gomez David,Pereiro Rosario,Fernández Beatriz

Publisher

MDPI AG

Subject

Inorganic Chemistry,Organic Chemistry,Physical and Theoretical Chemistry,Computer Science Applications,Spectroscopy,Molecular Biology,General Medicine,Catalysis

Link

http://www.mdpi.com/1422-0067/12/4/2200/pdf

Reference30 articles.

1. Thin-film-silicon solar cells;Cárabe;Opto-Electron. Rev,2004

2. Practical Handbook of Photovoltaics: Fundamentals and Application;Markvart,2003

3. Thin film silicon photovoltaics: Architectural perspectives and technological issues;Mercaldo;Appl. Energy,2009

4. Progress in Photovoltaics: Research and Application;Hegedus,2006

5. Thin Film Solar Cells;Poortmans,2006

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Characterization of Hydrogenated Amorphous Silicon Using Infrared Spectroscopy and Ellipsometry Measurements;Application and Characterization of Rubber Materials;2023-01-04

2. Structural, morphological and optical analysis related to the origin of the green and red emission band in a chiral Schiff base;Optik;2019-02

3. Optimization of intrinsic layer thickness, dopant layer thickness and concentration for a-SiC/a-SiGe multilayer solar cell efficiency performance using Silvaco software;EPJ Web of Conferences;2017