DLNR-SIQA: Deep Learning-Based No-Reference Stitched Image Quality Assessment

Author:

Ullah Hayat,Irfan Muhammad,Han KyungjinORCID,Lee Jong WeonORCID

Abstract

Due to recent advancements in virtual reality (VR) and augmented reality (AR), the demand for high quality immersive contents is a primary concern for production companies and consumers. Similarly, the topical record-breaking performance of deep learning in various domains of artificial intelligence has extended the attention of researchers to contribute to different fields of computer vision. To ensure the quality of immersive media contents using these advanced deep learning technologies, several learning based Stitched Image Quality Assessment methods have been proposed with reasonable performances. However, these methods are unable to localize, segment, and extract the stitching errors in panoramic images. Further, these methods used computationally complex procedures for quality assessment of panoramic images. With these motivations, in this paper, we propose a novel three-fold Deep Learning based No-Reference Stitched Image Quality Assessment (DLNR-SIQA) approach to evaluate the quality of immersive contents. In the first fold, we fined-tuned the state-of-the-art Mask R-CNN (Regional Convolutional Neural Network) on manually annotated various stitching error-based cropped images from the two publicly available datasets. In the second fold, we segment and localize various stitching errors present in the immersive contents. Finally, based on the distorted regions present in the immersive contents, we measured the overall quality of the stitched images. Unlike existing methods that only measure the quality of the images using deep features, our proposed method can efficiently segment and localize stitching errors and estimate the image quality by investigating segmented regions. We also carried out extensive qualitative and quantitative comparison with full reference image quality assessment (FR-IQA) and no reference image quality assessment (NR-IQA) on two publicly available datasets, where the proposed system outperformed the existing state-of-the-art techniques.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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