Generative Deep Learning-Based Thermographic Inspection of Artwork

Author:

Liu Yi1ORCID,Wang Fumin1,Jiang Zhili1,Sfarra Stefano2ORCID,Liu Kaixin3ORCID,Yao Yuan4ORCID

Affiliation:

1. Institute of Process Equipment and Control Engineering, Zhejiang University of Technology, Hangzhou 310023, China

2. Department of Industrial and Information Engineering and Economics, University of L’Aquila, Piazzale E. Pontieri n. 1, Monteluco di Roio, I-67100 L’Aquila, Italy

3. Shanxi Key Laboratory of Signal Capturing & Processing, North University of China, Taiyuan 030051, China

4. Department of Chemical Engineering, National Tsing Hua University, Hsinchu 300044, Taiwan

Abstract

Infrared thermography is a widely utilized nondestructive testing technique in the field of artwork inspection. However, raw thermograms often suffer from problems, such as limited quantity and high background noise, due to limitations inherent in the acquisition equipment and experimental environment. To overcome these challenges, there is a growing interest in developing thermographic data enhancement methods. In this study, a defect inspection method for artwork based on principal component analysis is proposed, incorporating two distinct deep learning approaches for thermographic data enhancement: spectral normalized generative adversarial network (SNGAN) and convolutional autoencoder (CAE). The SNGAN strategy focuses on augmenting the thermal images, while the CAE strategy emphasizes enhancing their quality. Subsequently, principal component thermography (PCT) is employed to analyze the processed data and improve the detectability of defects. Comparing the results to using PCT alone, the integration of the SNGAN strategy led to a 1.08% enhancement in the signal-to-noise ratio, while the utilization of the CAE strategy resulted in an 8.73% improvement.

Funder

National Natural Science Foundation of China

National Science and Technology Council, ROC

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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