Double-Exposure Method with Synchrotron White X-ray for Stress Evaluation of Coarse-Grain Materials

Abstract

Stress measurements of coarse-grained material are difficult using synchrotron X-ray diffraction because the diffraction patterns of coarse-grained materials are spotty. In addition, the center of the diffraction pattern is unknown for the transmitted X-ray beam. Here, a double-exposure method is proposed as the countermeasure against this issue. In the experiment, we introduce a CdTe pixel detector. The detector is a newly developed area detector and can resolve high-energy X-rays. The strains of the coarse-grained material can be measured using a combination of the double-exposure method, white synchrotron X-ray, and the CdTe pixel detector. The bending stress in an austenitic stainless steel plate was measured using the proposed technique. As a result, the measured stress corresponded to the applied bending stress.