Verification and Accuracy Analysis of Single-Frequency Occultation Processing Based on the BeiDou Navigation System

Author:

Li Ruimin1234,Du Qifei1234,Yang Ming1234,Tian Haoran1234,Sun Yueqiang1234,Meng Xiangguang1234ORCID,Bai Weihua1234,Wang Xianyi1234ORCID,Tan Guangyuan134,Hu Peng1234

Affiliation:

1. National Space Science Center, Chinese Academy of Sciences, Beijing 100190, China

2. School of Astronomy and Space Science, University of Chinese Academy of Sciences, Beijing 101408, China

3. Beijing Key Laboratory of Space Environment Exploration, Beijing 100190, China

4. Key Laboratory of Science and Technology on Space Environmental Situation Awareness, Chinese Academy of Sciences, Beijing 100045, China

Abstract

GNSS single-frequency occultation processing technology has the advantage of simple instrumentation, but it is not clear about the accuracy of the Beidou-based single-frequency occultation processing. This paper verifies the single-frequency occultation processing algorithm of the BeiDou navigation system (BDS) and analyzes its accuracy based on occultation observation data from the FY3E satellite. The research aimed to verify the single-frequency ionospheric relative total electron content (relTEC), analyze the accuracy of the reconstructed second frequency B3∗’s excess phase Doppler, and analyze the accuracy of the refractive index products. Results: (1) As for relTEC and excess phase Doppler, the correlation coefficient between single-frequency occultation processing and dual-frequency occultation processing is greater than 0.95. (2) The relative average deviations of the excess phase Doppler of B3∗ are mostly less than 0.2%, and the relative standard deviations are mostly around 0.5%. (3) The bias index and root mean square index of single/dual-frequency inversion have good consistency compared with ERA5 data. All the results show that the single- and dual-frequency inversion refractive index products have comparable accuracies, and the accuracy of the standard deviation of single-frequency inversion refractive index products over 25 km being slightly lower than that of dual-frequency inversion refractive index products.

Publisher

MDPI AG

Subject

Atmospheric Science,Environmental Science (miscellaneous)

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