Development and Application of a Rapid Scan Technique for Emissivity Measurements of Cooled-Down Molten Materials-Reference-Cited by-同舟云学术

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Development and Application of a Rapid Scan Technique for Emissivity Measurements of Cooled-Down Molten Materials

Published:2023-10-26 Issue: Volume: Page:
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Container-title:AITA 2023
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Author:

Ermini Ilse Maria¹²,Cosson Lionel¹,Fayon Franck¹,De Arrieta Iñigo González¹³,Rozenbaum Olivier¹,Vespa Pierrick⁴,De Sousa Meneses Domingos¹

Affiliation:

1. CNRS, CEMHTI UPR3079, Université D’Orléans, F-45071 Orléans, France

2. Laboratoire Commun Canopee, CNRS/Université de Lorraine/Saint-Gobain, F-54500 Saint-Gobain, France

3. Physics Department, University of the Basque Country (UPV/EHU), E-48940 Leioa, Spain

4. LSFC, UMR 3080 CNRS/Saint-Gobain CREE, Saint-Gobain Research Provence, 550 Avenue Alphonse Jauffret, F-84300 Cavaillon, France

Publisher

MDPI

Link

https://www.mdpi.com/2673-4591/51/1/8/pdf

Reference12 articles.

1. Problems, potentials and future of industrial crystallization;Ulrich;Front. Chem. Sci. Eng.,2013

2. Application of time resolved x-ray diffraction to study the solidification of glass-forming melts;Hennet;High Temp.-High Press.,2011

3. A time resolved 27Al NMR study of the cooling process of liquid alumina from 2450 °C to crystallization;Florian;Solid State Nucl. Magn. Reson.,1995

4. Time-resolved study of crystallization in deeply cooled liquid parahydrogen;Tejeda;Phys. Rev. Lett.,2011

5. Transparency through Structural Disorder: A New Concept for Innovative Transparent Ceramics;Saghir;Chem. Mat.,2015

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