Measuring the Flex Life of Conductive Yarns in Narrow Fabric
Author:
Affiliation:
1. Centre for Microsystems Technology (CMST), Interuniversity Microelectronics Centre (IMEC), Ghent University, 9000 Ghent, Belgium
Publisher
MDPI
Link
https://www.mdpi.com/2673-4591/30/1/3/pdf
Reference3 articles.
1. Accelerated lifetime tests on e-textiles: Design and fabrication of multifunctional test bench;Mura;J. Ind. Text.,2018
2. Wash Analyses of Flexible and Wearable Printed Circuits for E-Textiles and Their Prediction of Damages;Zaman;Electronics,2021
3. Bolton, W. (2015). Programmable Logic Controllers, Newnes. [6th ed.]. Chapter 4.
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1. Study of a Narrow Fabric-Based E-Textile System—From Research to Field Tests;Sensors;2024-07-17
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