Tracking the Local Structure Change during the Photoabsorption Processes of Photocatalysts by the Ultrafast Pump-Probe XAFS Method

Abstract

The birth of synchrotron radiation (SR) facilities and X-ray free electron lasers (XFELs) has led to the development of new characterization tools that use X-rays and opened frontiers in science and technology. Ultrafast X-ray absorption fine structure (XAFS) spectroscopy for photocatalysts is one such significant research technique. Although carrier behavior in photocatalysts has been discussed in terms of the band theory and their energy levels in reciprocal space (k-space) based on optical spectroscopic results, it has rarely been discussed where photocarriers are located in real-space (r-space) based on direct observation of the excited states. XAFS provides information on the local electronic and geometrical structures around an X-ray-absorbing atom and can address photocarrier dynamics in the r-space observed from the X-ray-absorbing atom. In this article, we discuss the time dependent structure change of tungsten trioxide (WO3) and bismuth vanadate (BiVO4) photocatalysts studied by the ultrafast pump-probe XAFS method in the femtosecond to nanosecond time scale with the Photon Factory Advanced Ring (PF-AR) and the SPring-8 Angstrom Compact free-electron LAser (SACLA). WO3 shows a femtosecond decay process of photoexcited electrons followed by a structural change to a metastable state with a hundred picosecond speed, which is relaxed to the ground-state structure with a nanosecond time constant. The Bi L3 edge of BiVO4 shows little contribution of the Bi 6s electron to the photoabsorption process; however, it is sensitive to the structural change induced by the photoexcited electron. Time-resolved XAFS measurements in a wide range time domain and with varied wavelengths of the excitation pump laser facilitate understanding of the overall details regarding the photocarrier dynamics that have a significant influence on the photocatalytic performance.