Seismic Damage Identification Method for Curved Beam Bridges Based on Wavelet Packet Norm Entropy

Author:

Deng Tongfa,Huang Jinwen,Cao Maosen,Li Dayang,Bayat Mahmoud

Abstract

Curved beam bridges, whose line type is flexible and beautiful, are an indispensable bridge type in modern traffic engineering. Nevertheless, compared with linear bridges, curved beam bridges have more complex internal forces and deformation due to the curvature; therefore, this type of bridge is more likely to suffer damage in strong earthquakes. The occurrence of damage reduces the safety of bridges, and can even cause casualties and property loss. For this reason, it is of great significance to study the identification of seismic damage in curved beam bridges. However, there is currently little research on curved beam bridges. For this reason, this paper proposes a damage identification method based on wavelet packet norm entropy (WPNE) under seismic excitation. In this method, wavelet packet transform is adopted to highlight the damage singularity information, the Lp norm entropy of wavelet coefficient is taken as a damage characteristic factor, and then the occurrence of damage is characterized by changes in the damage index. To verify the feasibility and effectiveness of this method, a finite element model of Curved Continuous Rigid-Frame Bridges (CCRFB) is established for the purposes of numerical simulation. The results show that the damage index based on WPNE can accurately identify the damage location and characterize the severity of damage; moreover, WPNE is more capable of performing damage location and providing early warning than the method based on wavelet packet energy. In addition, noise resistance analysis shows that WPNE is immune to noise interference to a certain extent. As long as a series of frequency bands with larger correlation coefficients are selected for WPNE calculation, independent noise reduction can be achieved.

Funder

the Key R&D Project of Jiangxi Science and Technology Department

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry

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