Measurement and Analysis of SSD Reliability Data Based on Accelerated Endurance Test

Author:

Wang YufeiORCID,Dong Xiaoshe,Zhang Xingjun,Wang Longxiang

Abstract

In recent years, NAND Flash-based solid-state drives (SSDs) have become more widely used in data centers and consumer markets. Data centers generally choose to provide high-quality storage services by deploying a large number of SSDs, but there are no effective preventive measures to reduce the impact of SSD failures currently. Some existing studies have analyzed the relevant factors related to SSD failures from different angles, but the characteristics of reliability changes exhibited by SSD throughout the life cycle have not been explored in depth. On the other hand, although the 3D manufacturing process has increased the storage density of the SSD, the mutual influence between the flash units has also increased, resulting in severe degradation of the performance and lifetime of the SSD. Therefore, in order to fully understand the reliability varying process of SSD throughout the life cycle, we first designed an SSD lifetime endurance test method, then conducted the endurance test and collected the reliability data for the entire life cycle of the 3D TLC SSD in the laboratory environment with reference to the JEDEC standard. Through the analysis of experimental data and its statistical correlation, it is found that SSD will produce a large number of uncorrectable errors before reaching the endurance limit, and there will be a phenomenon of continuous high operating temperature, as well as showing some intrinsic relationships about SSD reliability data. The findings in this paper are valuable for identifying whether an SSD is going to fail.

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Reference46 articles.

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