A Voltage-Based Hierarchical Diagnosis Approach for Open-Circuit Fault of Two-Level Traction Converters

Abstract

This paper proposes a voltage-based hierarchical diagnosis approach for insulated gate bipolar transistors (IGBTs) open-circuit fault of two-level AC-DC-AC traction converters. The proposed approach can diagnose the open-circuit fault in the single-phase rectifier as well as in the three-phase inverter without extra sensors. Moreover, no mandatory control signal injection is required, which ensures safe operation. In addition, the different levels of diagnostic results are flexibly determined by the presented hierarchical diagnosis architecture, which depends on the market requirements of wide use of IGBT modules. To be specific, firstly, a mixed-logic-dynamic estimation model of DC-link voltage is established. Secondly, the diagnosis characteristic function (DCF) is constructed by way of a residual characteristic analysis under normal and various open-circuit fault cases. Thirdly, the vector angular similarity function (VASF) is calculated for leg-level diagnosis and the control signals switching matching method is used to locate the fault in the device-level. Finally, the experimental results show the effectiveness of the proposed approach.