Characterization Circuit, Gate Driver and Fixture for Wide-Bandgap Power Semiconductor Device Testing

Abstract

The world is currently experiencing major advancement in the electrification of both the industrial and commercial sectors. This is part of an effort to reduce reliance on combustible fuels, reduce emissions, integrate renewable energy systems and increase efficiency. Due to the complexity of modern circuits and systems, any circuit’s design should start with proper simulation and device selection, to reduce overall cost and time of prototyping, both of which require accurate and thorough device characterization. Wide bandgap (WBG) power semiconductor devices offer superior characteristics over conventional devices, including faster switching speeds, higher breakdown voltage, lower losses, and higher operating temperature. These properties call for special test circuits and procedures for accurate characterization. In this work, custom characterization circuits and fixtures, suitable for WBG devices are designed, tested, and described. The circuits measure several of the main characteristics of voltage controlled WBG power switches. Different technology devices were tested and characterized.