A Wireless, Battery-Powered Probe Based on a Dual-Tier CMOS SPAD Array for Charged Particle Sensing

Author:

Minga Joana12ORCID,Brogi Paolo34ORCID,Collazuol Gianmaria56,Dalla Betta Gian-Franco78ORCID,Marrocchesi Pier Simone34,Morsani Fabio4,Pancheri Lucio78ORCID,Ratti Lodovico12,Torilla Gianmarco12,Vacchi Carla12

Affiliation:

1. Dipartimento di Ingegneria Industriale e dell’Informazione, Università degli Studi di Pavia, 27100 Pavia, Italy

2. INFN—Istituto Nazionale di Fisica Nucleare, Sezione di Pavia, 27100 Pavia, Italy

3. Dipartimento di Scienze Fisiche, della Terra e dell’Ambiente, Università di Siena, 53100 Siena, Italy

4. INFN—Istituto Nazionale di Fisica Nucleare, Sezione di Pisa, 56127 Pisa, Italy

5. Dipartimento di Fisica e Astronomia, Università di Padova, 35122 Padova, Italy

6. INFN—Istituto Nazionale di Fisica Nucleare, Sezione di Padova, 35131 Padova, Italy

7. Dipartimento di Ingegneria Industriale, Università di Trento, 38122 Trento, Italy

8. INFN—Istituto Nazionale di Fisica Nucleare, TIFPA, 38123 Trento, Italy

Abstract

A compact probe for charged particle imaging, with potential applications in source activity mapping and radio-guided surgery was designed and tested. The development of this technology holds significant implications for medical imaging, offering healthcare professionals accurate and efficient tools for diagnoses and treatments. To fulfill the portability requirements of these applications, the probe was designed for battery operation and wireless communication with a PC. The core sensor is a dual-layer CMOS SPAD detector, fabricated using 150 nm technology, which uses overlapping cells to produce a coincidence signal and reduce the dark count rate (DCR). The sensor is managed and interfaced with a microcontroller, and custom firmware was developed to facilitate communication with the sensor. The performance of the probe was evaluated by characterizing the on-board SPAD detector in terms of the DCR, and the results were consistent with the characterization measurements taken on the same chip samples using a purposely developed benchtop setup.

Funder

Italian Institute for Nuclear Physics

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

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