Dataset Bias Prediction for Few-Shot Image Classification

Author:

Kim Jang Wook1ORCID,Kim So Yeon12,Sohn Kyung-Ah12ORCID

Affiliation:

1. Department of Artificial Intelligence, Ajou University, Suwon 16499, Republic of Korea

2. Department of Software and Computer Engineering, Ajou University, Suwon 16499, Republic of Korea

Abstract

Dataset bias is a significant obstacle that negatively affects image classification performance, especially in few-shot learning, where datasets have limited samples per class. However, few studies have focused on this issue. To address this, we propose a bias prediction network that recovers biases such as color from the extracted features of image data, resulting in performance improvement in few-shot image classification. If the network can easily recover the bias, the extracted features may contain the bias. Therefore, the whole framework is trained to extract features that are difficult for the bias prediction network to recover. We evaluate our method by integrating it with several existing few-shot learning models across multiple benchmark datasets. The results show that the proposed network can improve the performance in different scenarios. The proposed approach effectively reduces the negative effect of the dataset bias, resulting in the performance improvements in few-shot image classification. The proposed bias prediction model is easily compatible with other few-shot learning models, and applicable to various real-world applications where biased samples are prevalent, such as VR/AR systems and computer vision applications.

Funder

National Research Foundation of Korea

IITP

Ministry of Education

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

Reference35 articles.

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2. Guyon, I., Luxburg, U.V., Bengio, S., Wallach, H., Fergus, R., Vishwanathan, S., and Garnett, R. (2017, January 4–9). Prototypical Networks for Few-shot Learning. Proceedings of the Advances in Neural Information Processing Systems, Long Beach, CA, USA.

3. Sung, F., Yang, Y., Zhang, L., Xiang, T., Torr, P.H., and Hospedales, T.M. (2018, January 18–23). Learning to Compare: Relation Network for Few-Shot Learning. Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR), Salt Lake City, UT, USA.

4. Ren, M., Ravi, S., Triantafillou, E., Snell, J., Swersky, K., Tenenbaum, J.B., Larochelle, H., and Zemel, R.S. (May, January 30). Meta-Learning for Semi-Supervised Few-Shot Classification. Proceedings of the International Conference on Learning Representations, Vancouver, BC, Canada.

5. Rusu, A.A., Rao, D., Sygnowski, J., Vinyals, O., Pascanu, R., Osindero, S., and Hadsell, R. (2019, January 6–9). Meta-Learning with Latent Embedding Optimization. Proceedings of the International Conference on Learning Representations, New Orleans, LA, USA.

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