A Multi-Feature Fusion-Based Automatic Detection Method for High-Severity Defects

Author:

Liu Jie1,Liang Cangming1,Feng Jintao2,Xiao Anhong2,Zeng Hui2,Wu Qujin1,Yu Tonglan1

Affiliation:

1. Department of Computer Science, University of South China, Hengyang 421001, China

2. Nuclear Power Institute of China, Chengdu 610213, China

Abstract

It is crucial to detect high-severity defects, such as memory leaks that can result in system crashes or severe resource depletion, in order to reduce software development costs and ensure software quality and reliability. The primary cause of high-severity defects is usually resource scheduling errors, and in the program source code, these defects have contextual features that require defect context to confirm their existence. In the context of utilizing machine learning methods for defect automatic confirmation, the single-feature label method cannot achieve high-precision defect confirmation results for high-severity defects. Therefore, a multi-feature fusion defect automatic confirmation method is proposed. The label generation method solves the dimensionality disaster problem caused by multi-feature fusion by fusing features with strong correlations, improving the classifier’s performance. This method extracts node features and basic path features from the program dependency graph and designs high-severity contextual defect confirmation labels combined with contextual features. Finally, an optimized Support Vector Machine is used to train the automatic detection model for high-severity defects. This study uses open-source programs to manually implant defects for high-severity defect confirmation verification. The experimental results show that compared with existing methods, this model significantly improves the efficiency of confirming high-severity defects.

Funder

National Natural Science Foundation of China

Research Foundation of Education Bureau of Hunan Province

Publisher

MDPI AG

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Hardware and Architecture,Signal Processing,Control and Systems Engineering

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