Unsharpness of Thermograms in Thermography Diagnostics of Electronic Elements

Abstract

Work temperature is a factor, which has a strong influence on the work of a semiconductor electronic element. Operation of an electronic element in an excessive temperature causes the element not to work correctly. For this reason, monitoring the temperature of the element is necessary. One of the methods, which allows the monitoring of electronic element temperature is thermography. This non-contact method can also be used during the operation of the electronic element. The reading of a thermal camera depends on several factors. One of these factors is the sharpness of the registered thermograms. For this reason, research was carried out to develop a simple tool that allows a clear classification of thermograms of electronic elements into sharp and unsharp thermograms. In the research carried-out, the sharpness of the registered thermograms of electronic elements was determined by different sharpness measures. In the research, it was shown that in the case of thermograms classified as sharp, a smaller error of temperature measurement was obtained with the use of a thermal imaging camera.