Comparative Analysis of Thermal Properties in Molybdenum Substrate to Silicon and Glass for a System-on-Foil Integration

Author:

Huang Tzu-Jung1ORCID,Kiebala Tobias1,Suflita Paul1,Moore Chad2,Housser Graeme2,McMahon Shane2,Puchades Ivan1ORCID

Affiliation:

1. Department of Microsystems Engineering, Rochester Institute of Technology, Rochester, NY 14623, USA

2. Lux Semiconductors, Albany, NY 12203, USA

Abstract

Advanced electronics technology is moving towards smaller footprints and higher computational power. In order to achieve this, advanced packaging techniques are currently being considered, including organic, glass, and semiconductor-based substrates that allow for 2.5D or 3D integration of chips and devices. Metal-core substrates are a new alternative with similar properties to those of semiconductor-based substrates but with the added benefits of higher flexibility and metal ductility. This work comprehensively compares the thermal properties of a novel metal-based substrate, molybdenum, and silicon and fused silica glass substrates in the context of system-on-foil (SoF) integration. A simple electronic technique is used to simulate the heat generated by a typical CPU and to measure the heat dissipation properties of the substrates. The results indicate that molybdenum and silicon are able to effectively dissipate a continuous power density of 2.3 W/mm2 as the surface temperature only increases by ~15 °C. In contrast, the surface temperature of fused silica glass substrates increases by >140 °C for the same applied power. These simple techniques and measurements were validated with infrared camera measurements as well as through finite element analysis via COMSOL simulation. The results validate the use of molybdenum as an advanced packaging substrate and can be used to characterize new substrates and approaches for advanced packaging.

Funder

Department of Defense—USAF/Lux semiconductors

Publisher

MDPI AG

Reference31 articles.

1. Systems-in-foil—Devices, fabrication processes and reliability issues;Dietzel;Microelectron. Reliab.,2008

2. (2024, March 26). Advanced Packaging Market Size, Share, Growth, Trends, Statistics Analysis Report. Available online: https://datahorizzonresearch.com/advanced-packaging-market-2386,.

3. Harmon, O., Basler, T., Björk, F., and Bodo (2024, March 26). Advantages of the 1200 V SiC Schottky Diode with MPS Design. Available online: https://www.infineon.com/dgdl/Infineon-Article_Advantages_of_the_1200V_SiC_Schottky_Diode_with_MPS_Design-Article-v01_00-EN.pdf?fileId=5546d46250cc1fdf0151674981861d76.

4. Scarpa, V., Kirchner, U., Gerlach, R., and Kern, R. (2024, March 26). New SiC Thin-Wafer Technology Paving the Way of Schottky Diodes with Improved Performance and Reliability. Available online: https://www.infineon.com/dgdl/Infineon-New_Sic_Thin-Wafer_Technology_Paving_the_way_of_Schottky_Diodes_With_Improved_Performance_and_Reliability-Editorials-v01_00-EN.pdf?fileId=db3a304339dcf4b1013a03213f8d5912.

5. The effect of wafer thinning and thermal capacitance on chip temperature of SiC Schottky diodes during surge currents;Damcevska;Sci. Rep.,2023

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