FEM Simulation-Based Adversarial Domain Adaptation for Fatigue Crack Detection Using Lamb Wave
Author:
Wang Li12, Liu Guoqiang2, Zhang Chao1, Yang Yu2, Qiu Jinhao1
Affiliation:
1. State Key Laboratory of Mechanics and Control of Mechanical Structures, Nanjing University of Aeronautics and Astronautics, Nanjing 210016, China 2. Structural Damage Monitoring Laboratory, Aircraft Strength Research Institute of China, Xi’an 710065, China
Abstract
Lamb wave-based damage detection technology shows great potential for structural integrity assessment. However, conventional damage features based damage detection methods and data-driven intelligent damage detection methods highly rely on expert knowledge and sufficient labeled data for training, for which collecting is usually expensive and time-consuming. Therefore, this paper proposes an automated fatigue crack detection method using Lamb wave based on finite element method (FEM) and adversarial domain adaptation. FEM-simulation was used to obtain simulated response signals under various conditions to solve the problem of the insufficient labeled data in practice. Due to the distribution discrepancy between simulated signals and experimental signals, the detection performance of classifier just trained with simulated signals will drop sharply on the experimental signals. Then, Domain-adversarial neural network (DANN) with maximum mean discrepancy (MMD) was used to achieve discriminative and domain-invariant feature extraction between simulation source domain and experiment target domain, and the unlabeled experimental signals samples will be accurately classified. The proposed method is validated by fatigue tests on center-hole metal specimens. The results show that the proposed method presents superior detection ability compared to other methods and can be used as an effective tool for cross-domain damage detection.
Funder
National Natural Science Foundation of China Natural Science Foundation of Jiangsu Province
Subject
Electrical and Electronic Engineering,Biochemistry,Instrumentation,Atomic and Molecular Physics, and Optics,Analytical Chemistry
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