Research on Surface Morphology of Gold Micro Bumps Based on Monte Carlo Method

Abstract

In advanced packaging technology, the micro bump has become an important means of chip stacking and wafer interconnection. The reliability of micro bumps, which plays an important role in mechanical support, electrical connection, signal transmission and heat dissipation, determines the quality of chip packaging. Surface morphological defects are one of the main factors affecting the reliability of micro bumps, which are closely related to materials and bonding process parameters. In this paper, the electrodeposition process of preparing gold bumps is simulated at the atomic scale using the Kinetic Monte Carlo method. The differences in surface morphology and roughness of the plated layer are studied from a microscopic perspective under different deposition parameters. The results show that the gold micro bumps prepared by electrodeposition have better surface quality under conditions of lower deposition voltage, lower ion concentration and higher plating temperature, which can provide significant guidance for engineering applications.