Design and Optimization of a Self-Protected Thin Film c-Si Solar Cell against Reverse Bias

Author:

Saif Omar M.1ORCID,Zekry Abdelhalim1ORCID,Shaker Ahmed2ORCID,Abouelatta Mohammed1ORCID,Alanazi Tarek I.3ORCID,Saeed Ahmed4ORCID

Affiliation:

1. Department of Electronics and Communications, Faculty of Engineering, Ain Shams University, Cairo 11566, Egypt

2. Engineering Physics and Mathematics Department, Faculty of Engineering, Ain Shams University, Cairo 11566, Egypt

3. Department of Physics, College of Science, Northern Border University, Arar 73222, Saudi Arabia

4. Electrical Engineering Department, Future University in Egypt, Cairo 11835, Egypt

Abstract

Current mismatch due to solar cell failure or partial shading of solar panels may cause a reverse biasing of solar cells inside a photovoltaic (PV) module. The reverse-biased cells consume power instead of generating it, resulting in hot spots. To protect the solar cell against the reverse current, we introduce a novel design of a self-protected thin-film crystalline silicon (c-Si) solar cell using TCAD simulation. The proposed device achieves two distinct functions where it acts as a regular solar cell at forward bias while it performs as a backward diode upon reverse biasing. The ON-state voltage (VON) of the backward equivalent diode is found to be 0.062 V, which is lower than the value for the Schottky diode usually used as a protective element in a string of solar cells. Furthermore, enhancement techniques to improve the electrical and optical characteristics of the self-protected device are investigated. The proposed solar cell is enhanced by optimizing different design parameters, such as the doping concentration and the layers’ thicknesses. The enhanced cell structure shows an improvement in the short-circuit current density (JSC) and the open-circuit voltage (VOC), and thus an increased power conversion efficiency (PCE) while the VON is increased due to an increase of the JSC. Moreover, the simulation results depict that, by the introduction of an antireflection coating (ARC) layer, the external quantum efficiency (EQE) is enhanced and the PCE is boosted to 22.43%. Although the inclusion of ARC results in increasing VON, it is still lower than the value of VON for the Schottky diode encountered in current protection technology.

Funder

Research & Innovation, Ministry of Education in Saudi Arabia

Publisher

MDPI AG

Subject

General Materials Science

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