Removing the transients electron trapping in P-N junction diode by using soft X-ray annealing method
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Published:2014
Issue:1
Volume:49
Page:72
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ISSN:0268-1900
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Container-title:International Journal of Materials and Product Technology
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language:en
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Short-container-title:IJMPT
Author:
Ueamanapong Surada,Srithanachai Itsara,Niemcharoen Surasak,Poyai Amporn
Publisher
Inderscience Publishers
Subject
Industrial and Manufacturing Engineering,Mechanical Engineering,Mechanics of Materials,Safety, Risk, Reliability and Quality