Analysing ION/IOFF in ultradeep-submicron CMOS devices using grooved nMOSFETs for low-power applications
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Published:2013
Issue:1
Volume:6
Page:24
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ISSN:1748-0698
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Container-title:International Journal of Signal and Imaging Systems Engineering
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language:en
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Short-container-title:IJSISE
Author:
Dhar Subhra,Pattanaik Manisha,Rajaram P.
Publisher
Inderscience Publishers
Subject
Electrical and Electronic Engineering,Control and Systems Engineering