Free-Space Two-Tier One-Port Calibration Using a Planar Offset Short for Material Measurement

Author:

Kang Jin-Seob

Abstract

The scattering parameters of a material under test (MUT) are prerequisites for characterizing the material parameters of the MUT. This paper describes a free-space two-tier one-port calibration method using a planar offset short as a free-space calculable reflect standard for measuring the scattering parameters of an MUT from the two successive one-port calibrations of a free-space material measurement system without a precise positioning system in free space. The two-tier one-port calibration method is validated by comparing the measurement results with those of the thru-reflect-line (TRL) calibration method for two reciprocal MUTs (glass plates of 2.780 mm and 4.775 mm thickness) in the W-band (75–110 GHz). Good agreement between the measurement results from the two calibration methods demonstrates that the free-space two-tier one-port calibration method using a planar offset short can be a feasible and effective alternative to the conventional free-space two-port calibration methods.

Funder

Ministry of Trade, Industry and Energy

Korea Research Institute of Standards and Science

Publisher

Korean Institute of Electromagnetic Engineering and Science

Subject

Electrical and Electronic Engineering,Computer Networks and Communications,Instrumentation,Radiation

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