One-Port Planar Near-Field Antenna Measurement and Corresponding Scatterer Compensation Method

Abstract

A one-port near-field antenna measurement technique with a small wire scatterer is proposed. In the proposed technique, a wire scatterer is scanned with an interval of less than a quarter wavelength, and the measurement is performed at the port of the antenna under test (AUT). A two-dimensional phase unwrapping method is used to remove 180° phase uncertainty. The data obtained in the near-field are transformed to the far-field pattern, and the scattering pattern is compensated for better measurements. The proposed measurement technique was validated by measuring the near-field of an AUT over a planar scanning surface. The far-field radiation pattern obtained using the proposed technique was compared with that obtained from a conventional commercial anechoic chamber. It was observed that they agreed well, especially in the region near the center.