Nonparametric Changepoint Estimation for Sequential Nonlinear Profile Monitoring

Author:

McGinnity Kelly1,Chicken Eric2,Pignatiello Joseph J.3

Affiliation:

1. Institute for Defense Analyses; Alexandria, VA 22311 USA

2. Florida State University; Tallahassee FL 32306 USA

3. Air Force Institute of Technology; WPAFB OH 45433 USA

Publisher

Wiley

Subject

Management Science and Operations Research,Safety, Risk, Reliability and Quality

Reference43 articles.

1. Statistical quality control applied to ion chromatography calibrations;Stover;Journal of Chromatography A,1998

2. Equipment fault detection using spatial signatures;Gardner;IEEE Transactions on Components, Packaging, and Manufacturing Technology, Part C,1997

3. Feature-preserving data compression of stamping tonnage information using wavelets;Jin;Technometrics,1999

4. Statistical process control for geometric specifications: on the monitoring of roundness profiles;Colosimo;Journal of Quality Technology,2008

5. Statistical process monitoring of nonlinear profiles using wavelets;Chicken;Journal of Quality Technology,2009

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