In situion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis-Reference-Cited by-同舟云学术

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In situion beam sputter deposition and X-ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis

Published:2016-05-26 Issue:1 Volume:49 Page:18-24
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Wilson Thomas A.¹,Barlow Anders J.²,Foster Michael L.¹,Bravo Sanchez Mariela²³,Portoles Jose F.²,Sano Naoko²,Cumpson Peter J.²,Fletcher Ian W.²

Affiliation:

1. School of Mechanical and Systems Engineering; Newcastle University; Newcastle upon Tyne NE1 7RU United Kingdom

2. National EPSRC XPS User's Service (NEXUS), School of Mechanical and Systems Engineering; Newcastle University; Newcastle upon Tyne NE1 7RU United Kingdom

3. CINVESTAV-Unidad Querétaro; Libramiento Norponiente 2000; Real de Juriquilla Querétaro Qro. 76000 México

Funder

European Union FP7 (Marie Curie Actions) programme ‘RADDEL’

European Regional Development Fund

Spanish Ministerio de Economía and Competitividad

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference17 articles.

1. Combinatorial Materials Science and Catalysis

2. COMBINATORIAL MATERIALS SYNTHESIS AND SCREENING: An Integrated Materials Chip Approach to Discovery and Optimization of Functional Materials

3. Combinatorial and High-Throughput Screening of Materials Libraries: Review of State of the Art

4. Combinatorial and High-Throughput Materials Science

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