Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces-Reference-Cited by-同舟云学术

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Effect of SIMS ionization probability on depth resolution for organic/inorganic interfaces

Published:2017-06-15 Issue:10 Volume:49 Page:933-939
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf Interface Anal

Author:

Popczun Nicholas J.¹^ORCID,Breuer Lars¹,Wucher Andreas²,Winograd Nicholas¹

Affiliation:

1. Department of Chemistry; The Pennsylvania State University; University Park PA 16802 USA

2. Fakultät für Physik; Universität Duisburg-Essen; 47048 Duisburg Germany

Funder

National Institutes of Health

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference28 articles.

1. The magic of cluster SIMS;Winograd;Anal Chem,2005

2. Molecular ion imaging and dynamic secondary ion mass spectrometry of organic compounds;Gillen;Anal Chem,1990

3. Secondary Ion Mass Spectrometry Imaging of Biological Cells and Tissues

4. Molecular Depth Profiling with Cluster Ion Beams

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1. ToF-SIMS Depth Profiling of Metal, Metal Oxide, and Alloy Multilayers in Atmospheres of H2, C2H2, CO, and O2;Journal of the American Society for Mass Spectrometry;2021-12-22

2. A New Approach to TOF-SIMS Analysis of the Phase Composition of Carbon-Containing Materials;Technical Physics Letters;2019-01

3. Reducing the Matrix Effect in Molecular Secondary Ion Mass Spectrometry by Laser Post-Ionization;The Journal of Physical Chemistry C;2017-08-29

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