Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells-Reference-Cited by-同舟云学术

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Scanning Probe Microscopy on Inorganic Thin Films for Solar Cells

Published:2016-07-22 Issue: Volume: Page:343-369
ISSN:
Container-title:Advanced Characterization Techniques for Thin Film Solar Cells
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Author:

Sadewasser Sascha¹,Visoly-Fisher Iris²

Affiliation:

1. INL - International Iberian Nanotechnology Laboratory; Laboratory for Nanostructured Solar Cells; Av. Mestre José Veiga s/n 4715-330 Braga Portugal

2. Ben-Gurion University of the Negev; Department of Solar Energy and Environmental Physics, Swiss Institute for Dryland Environmental and Energy Research, Jacob Blaustein Institutes for Desert Research; Midreshet Ben-Gurion 8499000 Israel

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527699025.ch13/fullpdf

Reference106 articles.

1. Surface studies by scanning tunneling microscopy;Binnig;Phys. Rev. Lett.,1982

2. Atomic force microscopy;Binnig;Phys. Rev. Lett.,1986

3. Atomic force microscope-force mapping and profiling on a sub 100-A scale;Martin;J. Appl. Phys.,1987

4. Role of covalent tip-surface interactions in noncontact atomic force microscopy on reactive surfaces;Pérez;Phys. Rev. Lett.,1997

5. Dynamic atomic force microscopy methods;García;Surf. Sci. Rep.,2002

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