Photon-In Photon-Out Spectroscopic Techniques for Materials Analysis: Some Recent Developments-Reference-Cited by-同舟云学术

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Photon-In Photon-Out Spectroscopic Techniques for Materials Analysis: Some Recent Developments

Published:2018-02-16 Issue: Volume: Page:123-136
ISSN:
Container-title:Synchrotron Radiation in Materials Science
language:
Short-container-title:

Author:

Sham Tsun-Kong¹

Affiliation:

1. University of Western Ontario; Department of Chemistry; Chemistry Building 030, 1151 Richmond Street London, ON N6A 5B7 Canada

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Reference31 articles.

1. Core Level Spectroscopy of Solids

2. NEXAFS Spectroscopy

3. X-Ray Data Booklet http://xdb.lbl.gov

4. Nanoparticles and nanowires: synchrotron spectroscopy studies

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1. Tracking coordination environment and optoelectronic structure of Eu3+ and Sm3+ sites via X-ray absorption spectroscopy and X-ray excited optical luminescence;Materials Today: Proceedings;2024-03

2. CHARACTERIZATION OF ELECTRONIC STRUCTURES AT ORGANIC–2D MATERIALS INTERFACES WITH ADVANCED SYNCHROTRON-BASED SOFT X-RAY SPECTROSCOPY;Surface Review and Letters;2021-04-28

3. Emerging X-ray imaging technologies for energy materials;Materials Today;2020-04

4. Theoretical X‐ray spectroscopy of transition metal compounds;WIREs Computational Molecular Science;2019-07-24

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