Hot Electron Nanoscopy and Spectroscopy (HENs)-Reference-Cited by-同舟云学术

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Hot Electron Nanoscopy and Spectroscopy (HENs)

Published:2017-08-16 Issue: Volume: Page:319-354
ISSN:
Container-title:Conductive Atomic Force Microscopy
language:
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Author:

Giugni Andrea¹,Torre Bruno¹,Allione Marco¹,Perozziello Gerardo²,Candeloro Patrizio²,Di Fabrizio Enzo¹²

Affiliation:

1. SMILEs Lab, Physical Science and Engineering Division (PSE); King Abdullah University of Science and Technology (KAUST), Ibn Al-Haytham Bldg.; Thuwal 23955-6900 Saudi Arabia

2. Departement of Experimental Clinics, Bionem Lab; University Magna Graecia; Campus “Salvatore Venuta” Viale Europa 88100 Germaneto-Catanzaro Italy

Publisher

Wiley-VCH Verlag GmbH & Co. KGaA

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/9783527699773.ch15/fullpdf

Reference82 articles.

1. Nano-Electronic Devices. Semiclassical and Quantum Transport Modeling,2011

2. Plasmonic nanolithography: a review;Xie;Plasmonics,2011

3. Atomic Force Microscope;Binnig;Phys. Rev. Lett.,1986

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A portable picometer reference actuator with 100 µm range, picometer resolution, subnanometer accuracy and submicroradian tip-tilt error for the characterization of measuring instruments at the nanoscale;Metrologia;2018-06-29

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