Fabrication of system with probe for high-frequency measurement applications-Reference-Cited by-同舟云学术

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Fabrication of system with probe for high-frequency measurement applications

Published:2010-06-17 Issue:9 Volume:52 Page:2083-2087
ISSN:0895-2477
Container-title:Microwave and Optical Technology Letters
language:en
Short-container-title:Microw. Opt. Technol. Lett.

Author:

Matsumoto Keiji,Choi Woon,Tomokage Hajime

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference26 articles.

1. Impedance matching probes for wireless applications;Basu;Cascade Microtech Application Note,1998

2. Selected topics in RF coplanar probing;Wartenberg;IEEE Trans Microwave Theory Tech,2003

3. An air coplanar wafer probe;Godshalk;Eur Microwave Conf,1994

4. Comparison between beryllium-copper and tungsten high frequency air coplanar probes;Carbonero;IEEE Trans Microwave Theory Tech,1995

5. Numerical analysis of coplanar-lines of arbitrary structure and its application to micro-probe design;Zhou;In Proceedings of the Asia Pacific Microwave Conference,1997

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