Power amplifier circuit defect detection based on improved Patch SVDD

Author:

Xie Zhonghui12,Kong Wa1,Zhou Xinyu3,Zhang Wence1,Zhong Yujie1,Xia Jing1ORCID

Affiliation:

1. School of Computer Science and Communication Engineering Jiangsu University Zhenjiang China

2. Jiangsu Key Laboratory of Security Technology for Industrial Cyberspace Jiangsu University Zhenjiang China

3. Department of Electronic Information Engineering Hong Kong Polytechnic University Hong Kong China

Abstract

AbstractIn the manufacturing process of power amplifier (PA), various defects on the circuit surface will seriously affect the circuit performance and its operation. To solve the above problems, this article proposes a circuit defect detection method based on improved patch‐based support vector data description algorithm (Patch SVDD), which uses contrastive learning to enhance the feature extraction ability of neural network. An image calibration algorithm is used for calibration preprocessing to enhance the robustness of the model. The Euclidean distance between a query image patch and its nearest normal patch is defined to be an anomaly score. For verification, three defects in the PA circuit, including components missing, solder contamination and component orientation dislocation, were detected. The experimental results show that, compared with conventional method, the area under receiver operating characteristic (AUROC) of the improved anomaly detection model increased from 90.1% to 95.1%, which improves the detection accuracy effectively.

Funder

National Natural Science Foundation of China

Publisher

Wiley

Subject

Electrical and Electronic Engineering,Computer Science Applications,Modeling and Simulation

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Guest editorial for the special issue on “Artificial intelligence and machine learning based approaches for modeling and design of electronic devices, circuits, and systems”;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2024-07

2. Self-supervised Algorithms for Anomaly Detection on X-Rays;Proceedings of the 33rd International Conference on Computer Graphics and Vision;2023

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