SEM-EDS with low primary electron energy as a tool of surface analysis-Reference-Cited by-同舟云学术

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SEM-EDS with low primary electron energy as a tool of surface analysis

Published:2014-03-28 Issue:10-11 Volume:46 Page:865-868
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Nagoshi M.¹,Sato K.¹

Affiliation:

1. Steel Research Laboratory; JFE Steel Corporation; 1, Kawasaki-cho Chiba 260-0835 Japan

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference5 articles.

1. M. Nagoshi T. Kawano K. Sato Proceedings of Asian Steel'06 2006

2. K. Sato H. Noro M. Nagoshi K. Yamada K. Tanaka S. Tachibana Proceedings of the 17th International Microscopy Congress (IMC17) 2010 I3 6

3. The reliability of quantitative analysis with AES

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