Hierarchical cluster analysis for exposure assessment of workers in the semiconductor health study-Reference-Cited by-同舟云学术

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Hierarchical cluster analysis for exposure assessment of workers in the semiconductor health study

Published:2010-08-16 Issue:6 Volume:28 Page:713-722
ISSN:0271-3586
Container-title:American Journal of Industrial Medicine
language:en
Short-container-title:Am. J. Ind. Med.

Author:

Hines Cynthia J.,Selvin Steve,Samuels Steven J.,Hammond S. Katharine,Woskie Susan R.,Hallock Marilyn F.,Schenker Marc B.

Publisher

Wiley

Subject

Public Health, Environmental and Occupational Health

Reference16 articles.

1. A model for assessing occupational exposure to extremely low-frequency magnetic fields in fabrication rooms in the Semiconductor Health Study;Abdollahzadeh;Am J Ind Med,1995

2. Patterns of chemical use and exposure control in the Semiconductor Health Study;Hallock;Am J Ind Med,1995

3. The tiered exposure-assessment strategy in the Semiconductor Health Study;Hammond;Am J Ind Med,1995

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2. Exposures to Volatile Organic Compounds among Healthcare Workers: Modeling the Effects of Cleaning Tasks and Product Use;Annals of Work Exposures and Health;2018-06-21

3. Using Hierarchical Cluster Models to Systematically Identify Groups of Jobs With Similar Occupational Questionnaire Response Patterns to Assist Rule-Based Expert Exposure Assessment in Population-Based Studies;The Annals of Occupational Hygiene;2014-12-03

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