Mathematical topographical correction of XPS images using multivariate statistical methods
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Cited by 19 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Surface analysis insight note: An example of a cluster analysis of spectra from an X‐ray photoelectron spectroscopy image;Surface and Interface Analysis;2023-11-14
2. Imaging XPS for industrial applications;Journal of Electron Spectroscopy and Related Phenomena;2019-02
3. Rapid multivariate analysis of 3D ToF-SIMS data: graphical processor units (GPUs) and low-discrepancy subsampling for large-scale principal component analysis;Surface and Interface Analysis;2016-05-05
4. Multivariate analysis of extremely large ToFSIMS imaging datasets by a rapid PCA method;Surface and Interface Analysis;2015-08-27
5. Electrode/Electrolyte Interface of Composite α-Li3V2(PO4)3 Cathodes in a Nonaqueous Electrolyte for Lithium Ion Batteries and the Role of the Carbon Additive;Chemistry of Materials;2015-04-23
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