An application for near-real-time analysis of XPS data-Reference-Cited by-同舟云学术

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An application for near-real-time analysis of XPS data

Published:2010-04-22 Issue:6-7 Volume:42 Page:1061-1065
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Lea A. S.,Swanson K. R.,Haack J. N.,Castle J. E.,Tougaard S.,Baer D. R.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference13 articles.

1. Module to guide the expert use of x-ray photoelectron spectroscopy by corrosion scientists

2. The feasibility of an XPS expert system demonstrated by a rule set for carbon contamination

3. Report on the 34th IUVSTA workshop‘XPS: From Spectra to Results—Towards an Expert System’

4. D. Watson 2008 DLL supplied by Physical Electronics after non-disclosure agreement signed

5. Practical Methods for Detecting Peaks in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Perspective on improving the quality of surface and material data analysis in the scientific literature with a focus on x-ray photoelectron spectroscopy (XPS);Journal of Vacuum Science & Technology A;2023-05-01

2. Practical guides for x-ray photoelectron spectroscopy (XPS): Interpreting the carbon 1s spectrum;Journal of Vacuum Science & Technology A;2021-01

3. Film thickness measurement and contamination layer correction for quantitative XPS;Surface and Interface Analysis;2016-01-22

4. Comparative study of the native oxide on 316L stainless steel by XPS and ToF-SIMS;Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films;2015-09

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