Asymmetry in bright field images of stacking faults
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference7 articles.
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Cited by 9 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. A Technique for Determining the Number of Adjacent Intrinsic Faults in Multi-Layered Stacking Fault Configurations Using Complementary Strong and Weak Beam Electron Microscope Images;physica status solidi (a);1997-06
2. On the symmetry characteristics of diffraction contrast images of microtwins;Ultramicroscopy;1991-08
3. A bright-field method for determining the nature of stacking faults in FCC materials which is applicable to thin crystals;Proceedings, annual meeting, Electron Microscopy Society of America;1990-08
4. The many beam dynamical theory of contrast in electron microscope images of microtwins for the non-symmetrical Laue and non-column cases;Physica Status Solidi (a);1989-09-16
5. On Assessing Deviations from Symmetrical Laue Diffraction Conditions Using TEM Images of Stacking Faults;Physica Status Solidi (a);1989-07-16
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