Author:
Dubowik J.,Kudryavtsev Yu. V.,Krassovskii E. E.
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference17 articles.
1. Spectroscopic ellipsometry: A new tool for nondestructive depth profiling and characterization of interfaces
2. , and , 5th General Conf. Condensed Matter Division of the Europ. Phys. Soc., Techn. Univ. Berlin, March 1985, Europhys. Conf. Abstracts, EPS, Berlin 1985.
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献