Determination of structure factors of germanium by the critical-voltage and convergent-beam diffraction methods
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Reference29 articles.
1. X-Ray Structure Factors of Germanium Determined from the Half-Widths of Bragg-Case Diffraction Curves
2. A general structure factor formalism for interpreting accurate X-ray and neutron diffraction data
3. The significance of accurate structure factors
4. Accuracies of experimental structure factor values
5. The determination of structure factors from dynamical effects in electron diffraction
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1. Structure factors and bonding in ΒNiAl;Journal of Phase Equilibria;1997-12
2. Is it feasible to determine the bonding charge density of stoichiometric γ-TiAl through structure factor measurements?;Philosophical Magazine Letters;1993-07
3. On the accurate measurement of structure-factor amplitudes and phases by electron diffraction;Acta Crystallographica Section A Foundations of Crystallography;1993-03-01
4. Measurement of small structure factors by the critical-voltage effect in HEED: The superlattice reflections in β'nial, β'CoAl and γtial;Proceedings, annual meeting, Electron Microscopy Society of America;1992-08
5. Automated structure factor refinement from convergent-beam patterns;Ultramicroscopy;1991-06
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