Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination-Reference-Cited by-同舟云学术

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Remeasurement of characteristic X-ray emission lines and their application to line profile analysis and lattice parameter determination

Published:1994-05-16 Issue:1 Volume:143 Page:23-34
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Härtwig J.,Hölzer G.,Förster E.,Goetz K.,Wokulska K.,Wolf J.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Remeasurement of the profile of the characteristic CuKα emission line with high precision and accuracy

2. Study of the Kα emission spectrum of copper

3. Wavelength, energy shape, and structure of theCuKα1x-ray emission line

4. Structure and wavelength of the Cu Kα2x-ray emission line

5. and , CODATA Bulletin No. 63, Pergamon Press, Oxford 1986.

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