Positron profiles and positron annihilation in thin layers-Reference-Cited by-同舟云学术

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Positron profiles and positron annihilation in thin layers

Published:1982-05-16 Issue:1 Volume:71 Page:145-151
ISSN:0031-8965
Container-title:physica status solidi (a)
language:de
Short-container-title:phys. stat. sol. (a)

Author:

Pogrernyak A. D.,Kuzmttokh V. A.,Arefev K. P.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference17 articles.

1. Positron annihilation in boron-implanted n-type silicon

2. Positron implantation-profile effects in solids

3. Profiles and absorption coefficients of positrons implanted in solids from radioactive sources

4. Izv. vuzov, Viz. No. 1, 17 (1973).

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Defects in sputter-deposited aluminium films, studied by X-ray diffraction and positron annihilation;Scripta Metallurgica et Materialia;1995-08

2. Increased wear resistance and positron annihilation in Cu exposed to high power ion beam;Physics Letters A;1987-08

3. Positron Annihilation and Profiles of Radiation Damages in GaAs and Si Crystals Irradiated by Supercurrent Proton or Electron Beams;Physica Status Solidi (a);1984-01-16

4. Study of defect annealing by supercurrent proton beam irradiation and of radiation defect profiles in GaAs by the positron annihilation method;Physics Letters A;1983-09

5. Positron annihilation in GaAs crystals irradiated by high-current protons;Soviet Physics Journal;1983-06

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