Coefficient of linear expansion of silicon and germanium by double crystal X-ray spectrometer-Reference-Cited by-同舟云学术

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Coefficient of linear expansion of silicon and germanium by double crystal X-ray spectrometer

Published:1971-04-16 Issue:1 Volume:5 Page:K51-K53
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Bhalla A. S.,White E. W.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference2 articles.

1. A Versatile Vacuum Scanning Double Crystal Spectrometer for Soft X-Ray Absorption Edge Studies

2. Thermal Expansion of Some Crystals with the Diamond Structure

Cited by 9 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High-accuracy standard specimens for the line-focus-beam ultrasonic material characterization system;IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control;2002-06

2. Precise determination of lattice parameter and thermal expansion coefficient of silicon between 300 and 1500 K;Journal of Applied Physics;1984-07-15

3. Bibliography;Thermophysical Properties Research Literature Retrieval Guide 1900–1980;1982

4. ADDITIONAL REFERENCES;Thermal Expansion of Crystals;1979

5. Numerical Data on Thermal Linear Expansion of Nonmetallic Solids;Thermal Expansion;1977

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