Chemical bond and related properties of SiO2-Reference-Cited by-同舟云学术

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Chemical bond and related properties of SiO2

Published:1981-05-16 Issue:1 Volume:65 Page:271-280
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Engelke R.,Roy Th.,Neumann H.-G.,Hübner K.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference28 articles.

1. Chemical bond and related properties of SiO2. VII. Structure and electronic properties of the SiOx region of Si–SiO2 interfaces

2. Statistical investigations of the structure of SiOx

3. in: SiO2 - Herstellung, Struktur und Eigenschaften, Vol. II, and , Wilhelm-Pieck- Universität Rostock, 1979 (p. 7).

4. Diffraction Investigation on the Structure of SiOx

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