Quantitative Microscopy of Thin Films-Reference-Cited by-同舟云学术

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Quantitative Microscopy of Thin Films

Published:1993-06-16 Issue:2 Volume:137 Page:557-567
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Kisielowski C.,Schwander P.,Kim Y.,Rouvière J.-L.,Ourmazd A.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference25 articles.

1. in: Dislocations in Solids, Vol. 7, Ed. Elsevier Science Publ. Co., Amsterdam/New York 1986 (p. 113).

2. Dislocations and plasticity in semiconductors. I — Dislocation structures and dynamics

3. Interpretation of dislocation propagation velocities in strained GexSi1−x/Si(100) heterostructures by the diffusive kink pair model

4. , and , Materials Science & Technology, A Comprehensive Review, Vol. 4, Ed. VCH Weinheim 1991.

5. Chemical Mapping of Semiconductor Interfaces at Near-Atomic Resolution

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tunnelling through rough barriers;Journal of Physics: Condensed Matter;1994-02-07

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