Binary states in integrated circuits investigated by laser scanning microscopy with optical beam induced current-Reference-Cited by-同舟云学术

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Binary states in integrated circuits investigated by laser scanning microscopy with optical beam induced current

Published:1989-10-16 Issue:2 Volume:115 Page:607-615
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Bergner H.,Damm T.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference7 articles.

1. and , Theory and Practice of Laser Scanning Microscopy, Academic Press, Inc., London 1984.

2. Thermal mapping of transistors with a laser scanner

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Identification of hot spots in integrated circuits by laser scanning microscopy;Microelectronic Engineering;1991-05

2. A time-resolved optical beam induced current method;Microelectronic Engineering;1990-05

3. Investigation of Internal Signal Propagation of an Integrated Circuit with High Temporal Resolution;Springer Proceedings in Physics;1990

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