EBIC Microscopy Applied to Glide Dislocations)-Reference-Cited by-同舟云学术

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EBIC Microscopy Applied to Glide Dislocations)

Published:1990-02-16 Issue:2 Volume:117 Page:417-428
ISSN:0031-8965
Container-title:physica status solidi (a)
language:de
Short-container-title:phys. stat. sol. (a)

Author:

Alexander H.,Dietrich S.,Hühne M.,Kolbe M.,Weber G.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference29 articles.

1. in: Dislocations in Solids, Vol 7, Ed. North-Holland Publ. Co., 1986

2. and , in: Defects in Crystals, Ed. World-Scientific, Singapore 1988 (p. 290)

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