Quantum mechanical determination of the potential and carrier distributions in the inversion layer of metal—oxide—semiconductor devices-Reference-Cited by-同舟云学术

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Quantum mechanical determination of the potential and carrier distributions in the inversion layer of metal—oxide—semiconductor devices

Published:1979-11-16 Issue:1 Volume:56 Page:129-141
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:en
Short-container-title:Phys. Stat. Sol. (a)

Author:

Hsing C. T.,Kennedy D. P.,Sutherland A. D.,van Vliet K. M.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference22 articles.

1. Physics of Semiconductor Devices, Wiley, New York 1969.

2. Physics and Technology of Semiconductor Devices, Wiley, New York 1967.

3. The Theory and Practice of Microelectronics, Wiley, New York 1968.

4. Theory and Applications of Field Effect Transistors, Wiley, New York 1970.

5. , and , IBM J. Res. Developm. 427, (1964).

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