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Ion induced carbon contamination and recoil implantation

  • Published:1977-12-16 Issue:2 Volume:44 Page:K141-K145
  • ISSN:0031-8965
  • Container-title:Physica Status Solidi (a)
  • language:en
  • Short-container-title:Phys. Stat. Sol. (a)

Author:

Naehring F. K.,Schmidt A.,Schöneich J.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference16 articles.

1. Kornlose und h�chstaufl�sende Fixierung von Ionen- und Elektronenbildern mittels lichtoptischer Interferenzfilter

2. Contamination layers formed by argon ion bombardment

3. , and , Proc. Internat. Conf. Equipment for Ion Beam Applications to Materials, Smolenice (CSSR), Oct. 20 to 22, 1975 (p. 87).

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