Study of X-ray diffraction pictures of crystal imperfections by means of a triple interferometer-Reference-Cited by-同舟云学术

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Study of X-ray diffraction pictures of crystal imperfections by means of a triple interferometer

Published:1990-03-16 Issue:1 Volume:118 Page:21-27
ISSN:0031-8965
Container-title:physica status solidi (a)
language:de
Short-container-title:phys. stat. sol. (a)

Author:

Aboyan A. O.,Bezirganyan P. A.,Khzardzhyan A. A.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference4 articles.

1. X-ray interferometric pictures of dislocations

2. X-ray and neutron interferometry

3. X-Ray Crystal Optics, Izd. Nauka, Moskva 1982 (in Russian).

4. and , Moiré Analysis of Strain, Izd. Mir, Moskva 1974 (in Russian).

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Experimental Investigation of the Fine Structure of X-Ray Diffraction Patterns Obtained from Two-Block Crystalline Systems with a Nondiffraction Zone;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2022-08

2. Investigation of crystal imperfections with multiple X-Ray interferometers;Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques;2017-09

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