Role of entrance slit in the X-ray section topography of single crystals-Reference-Cited by-同舟云学术

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Role of entrance slit in the X-ray section topography of single crystals

Published:1980-12-16 Issue:2 Volume:62 Page:431-440
ISSN:0031-8965
Container-title:Physica Status Solidi (a)
language:de
Short-container-title:Phys. Stat. Sol. (a)

Author:

Aristov V. V.,Kohn V. G.,Polovinkina V. I.

Publisher

Wiley

Subject

Condensed Matter Physics,Electronic, Optical and Magnetic Materials,Condensed Matter Physics,Electronic, Optical and Magnetic Materials

Reference13 articles.

1. Dynamical diffraction theory of waves in distorted crystals. II. Perturbation theory

2. Shape of Extinction Fringes and Determination of the Burgers Vector in Single-Crystal Interferometric Techniques

3. X‐ray diffraction topographs of silicon crystals with superposed oxide film. II. Pendellösung fringes: comparison of experiment with theory

4. , , and , Proc. IV. Conf. Dynamic Effects of X-Ray and Electron Scattering, LIYaF, Leningrad, 1977 (p. 168) (in Russian).

5. Direct Observation of Individual Dislocations by X‐Ray Diffraction

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